DAFS Analysis of Magnetite A. I. Frenkel, J. O. Cross, D. M. Fanning and I. K. Robinson, J. Synchrotron Radiation 6 332-334 (1999)
Glancing Incidence Diffuse X-ray Scattering Studies of Implantation Damage in Si K. Nordlund, P. Partyka, Y. Zhong, I. K. Robinson, R. S. Averback and P. Ehrhart, Nuclear Instruments and Methods in Physics Research B 147 399-409 (1999)
Buffer Layer Strain Transfer in AlN/GaN near Critical Thickness C. Kim, I. K. Robinson, J. Myoung, K. Shim and K. Kim, Journal of Applied Physics 85 4040-4 (1999)
Structure of Cu(115): the Clean Surface and its O-induced Facets D. A. Walko and I. K. Robinson, Physical Review B 59 15446-56 (1999)
Coherent X ray Diffraction Imaging of Silicon Oxide Growth I. K. Robinson, J. L. Libbert, I. A. Vartanyants, J. A. Pitney, D. M. Smilgies, D. L. Abernathy and G. Grübel, Physical Review B 60 9965-9972 (1999)
Phase transitions in lead zirconate thin films D. M. Fanning, I. K. Robinson, D. A. Payne and T. Tani, in Ferroelectric Thin Films VII, ed R. E. Jones, R. W. Schwarz, S. Summerfelt and I. K. Yoo, Proceedings of the Materials Research Society, Boston, 541 511-516 (1999)
Multilayer Relaxation of the Cu(115) Surface Studied by Surface X-ray Diffraction and LEED, M. Albrecht, R. Blome, H. L. Meyerheim, W. Moritz, I. K. Robinson and D. Walko, submitted to Surface Science (1999)
Thickness-Induced Buckling of bcc Copper Films B. M. Ocko, I. K. Robinson, M. Weinert, R. J. Randler and D. M. Kolb, Physical Review Letters 83 780-783 (1999)
Surface Structure of O/Cu(104) Facets Determined by X-ray Diffraction, D. A. Walko and I. K. Robinson, Surface Review and Letters 6 851-857 (1999)
Phase Retrieval in Coherent Diffraction from Cu3Au Antiphase Domains J. A. Pitney, I. A. Vartaniants and I. K. Robinson, Proceedings of the SPIE conference on Digital Image Recovery and Synthesis IV, 3815 199-207 (1999)